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Title: Morphological structure of silicon carbide grown by chemical vapor deposition on titanium carbide using silane and ethylene

Journal Article · · Journal of the Electrochemical Society; (United States)
DOI:https://doi.org/10.1149/1.2054808· OSTI ID:7289118
;  [1]
  1. Oregon Graduate Inst. of Science and Technology, Portland, OR (United States). Dept. of Electrical Engineering and Applied Physics

The morphologies of polycrystalline SiC layers and [beta]-SiC epilayers deposited onto TiC[sub x] by pyrolysis of SiH[sub 4] and C[sub 2]H[sub 4] in diluted atmospheres of Ar, He, H[sub 2], Ar + He, Ar + H[sub 2], and He + H[sub 2] were studied. The fraction of the TiC[sub x] surface covered by SiC was dependent on the diluent atmosphere and the TiC[sub x] temperature (T[sub s]). The morphology and growth rate were dependent on T[sub s], at a fixed C:Si ratio. Epilayer morphologies, similar to those reported for [beta]-SiC on Si were obtained in Ar + H[sub 2], and He + H[sub 2] atmospheres, without thermal ramping, and in H[sub 2] with thermal ramping; where, the optimum C:Si ratio was a function of T[sub s]. Ratios of C:Si from 0.16 to 7.0 yielded [beta]-SiC epitaxial growth in Ar and He diluent atmospheres. The occurrence of homogeneous nucleation was strongly influence by diluted to reactant ratios and T[sub s].

OSTI ID:
7289118
Journal Information:
Journal of the Electrochemical Society; (United States), Vol. 141:3; ISSN 0013-4651
Country of Publication:
United States
Language:
English