Infrared microscope inspection apparatus
Patent
·
OSTI ID:7261671
Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface. 4 figs.
- Research Organization:
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- DOE Contract Number:
- AC02-76ET20279
- Assignee:
- Massachusetts Inst. of Tech., Cambridge, MA (United States)
- Patent Number(s):
- US 4501966; A
- Application Number:
- PPN: US 6-243415
- OSTI ID:
- 7261671
- Resource Relation:
- Patent File Date: 13 Mar 1981
- Country of Publication:
- United States
- Language:
- English
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