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Title: Infrared microscope inspection apparatus

Patent ·
OSTI ID:7261671

Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface. 4 figs.

Research Organization:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
DOE Contract Number:
AC02-76ET20279
Assignee:
Massachusetts Inst. of Tech., Cambridge, MA (United States)
Patent Number(s):
US 4501966; A
Application Number:
PPN: US 6-243415
OSTI ID:
7261671
Resource Relation:
Patent File Date: 13 Mar 1981
Country of Publication:
United States
Language:
English