Trace element and hydrocarbon analysis of mercuric iodide by ion microprobe and electron induced x-ray fluorescence techniques
Since 1971, research on mercuric iodide (HgI/sub 2/) crystals as nuclear radiation detectors has generated a growing interest in the semiconductor and crystalline properties of this material. An investigation pursued only recently pertains to the trace element and hydrocarbon impurities present in the raw HgI/sub 2/ starting material. While various purifying schemes have been employed, there is only a very limited understanding of their effectiveness. This paper describes studies undertaken with ion microprobe and electron x-ray fluorescence techniques (1) to quantify the trace elements in the residues removed from the starting material as well as in the final single crystals, and (2) to show the influence of impurity removal on nuclear detector performance. Both elemental and hydrocarbon contamination have been identified. The results indicate a preferred method of purification of the HgI/sub 2/ growth material.
- Research Organization:
- EG and G, Inc., Santa Barbara, CA (USA)
- DOE Contract Number:
- EY-76-C-08-1183
- OSTI ID:
- 7254946
- Report Number(s):
- EGG-1183-2355; CONF-770204-2; TRN: 77-013953
- Resource Relation:
- Conference: 28. Pittsburgh conference on analytical chemical and applied spectroscopy, Cleveland, OH, USA, 28 Feb 1977
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALUMINIUM
ION MICROPROBE ANALYSIS
CALCIUM
CARBON
CHROMIUM
COPPER
X-RAY FLUORESCENCE ANALYSIS
HGI2 SEMICONDUCTOR DETECTORS
IMPURITIES
IRON
MERCURY IODIDES
CHEMICAL ANALYSIS
POTASSIUM
SILICON
SODIUM
ZINC
IODINE
MERCURY
PURIFICATION
TRACE AMOUNTS
ALKALI METALS
ALKALINE EARTH METALS
ELEMENTS
HALIDES
HALOGEN COMPOUNDS
HALOGENS
IODIDES
IODINE COMPOUNDS
MEASURING INSTRUMENTS
MERCURY COMPOUNDS
MERCURY HALIDES
METALS
NONDESTRUCTIVE ANALYSIS
NONMETALS
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SEMIMETALS
TRANSITION ELEMENTS
X-RAY EMISSION ANALYSIS
400103* - Radiometric & Radiochemical Procedures- (-1987)
400104 - Spectral Procedures- (-1987)
440101 - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments