X-ray spectral microanalysis of antimony telluride single crystals doped with tin and thallium

Journal Article · Sun Jun 01 00:00:00 EDT 1986 · Inorg. Mater. (Engl. Transl.); (United States)

OSTI ID:7240769

Mavlonov, S; Sherov, P N

Single crystals of thallium-doped antimony telluride were grown from a melt by the Czochralski method; as a result, the impurity distribution was distributed more uniformly in the melt and the concentration in the liquid and solid phases is not observed to vary during the growth process. The authors considered the case when the antimony telluride single crystals were observed to have excess tellurium. It is shown that Sb/sub 2/Te/sub 3/ single crystals doped with 0.01 mass % Th and 0.1-1.0 mass % Sn have a uniform impurity distribution.

• Research Organization: Umarov Physico technical Institute, Tadzhik SSR Acad. of Sci.
• OSTI ID: 7240769
• Journal Information: Inorg. Mater. (Engl. Transl.); (United States), Vol. 22:1
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ANTIMONY TELLURIDES
CRYSTAL DOPING
ELECTRIC CONDUCTIVITY
X-RAY SPECTRA
CRYSTAL GROWTH
CZOCHRALSKI METHOD
DISLOCATIONS
ELECTRON MICROPROBE ANALYSIS
IMPURITIES
METALLURGICAL EFFECTS
MONOCRYSTALS
P-TYPE CONDUCTORS
THALLIUM
TIN
VACANCIES
ANTIMONY COMPOUNDS
CHALCOGENIDES
CHEMICAL ANALYSIS
CRYSTAL DEFECTS
CRYSTAL GROWTH METHODS
CRYSTAL STRUCTURE
CRYSTALS
ELECTRICAL PROPERTIES
ELEMENTS
LINE DEFECTS
MATERIALS
METALS
MICROANALYSIS
PHYSICAL PROPERTIES
POINT DEFECTS
SEMICONDUCTOR MATERIALS
SPECTRA
TELLURIDES
TELLURIUM COMPOUNDS
360603* - Materials- Properties