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Title: An optimum interpolation method applied to the resampling of NOAA AVHRR data

Journal Article · · IEEE Transactions on Geoscience and Remote Sensing (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/36.285196· OSTI ID:7226468
;  [1]
  1. Remote Sensing Unit, Valencia (Spain)

Two main problems must be solved in the geometric processing of satellite data: geometric registration and resampling. When the data must be geometrically registered over a reference map, and particularly when the output pixel size is not the same as the original pixel size, the quality of the resampling can determine the quality of the output, not only in the visual appearance of the image, but also in the numerically interpolated values when used in multitemporal or multisensor studies. The optimum'' interpolation algorithm for AVHRR data is defined over a 6 x 6 window in order to consider overlapping effects among adjacent pixels. The optimum method, as mathematically defined, is highly expensive in CPU time. Then, a big effort is necessary to implement the algorithms so that they could be operationally applied. Two approaches are considered: a general numerical method (assuming a realistic spatial response for function) and a pseudo-analytical approximation (assuming a simplified Gaussian pulse as spatial response function). The analytical method requires only 2% of the CPU-time required by the fully numerical approach. Some examples are given by comparing the optimum interpolation technique with some other traditional methods. A Landsat TM image corresponding to the same date of the AVHRR image is used to test the quality of the radiometric interpolation procedure. The main advantage of the optimum interpolation is given by the fact that the resulting interpolated image loses the memory'' of the original pixel spacing in the image, which is not true for classical interpolation approaches.

OSTI ID:
7226468
Journal Information:
IEEE Transactions on Geoscience and Remote Sensing (Institute of Electrical and Electronics Engineers); (United States), Vol. 32:1; ISSN 0196-2892
Country of Publication:
United States
Language:
English