X-ray sensitivity of a charge-coupled-device array

Journal Article · Wed Jun 01 00:00:00 EDT 1977 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.323974· OSTI ID:7216661

Peckerar, M C; Baker, W D; Nagel, D J

The quantitative response of a charge-coupled device (CCD) to x rays in the 5--14-keV range was measured and computed. Comparison of experimental and theoretical quantum efficiencies provides a method to determine electron diffusion lengths in these devices. Compared to a common x-ray film, the CCD amplifier combination tested in this work has a similar threshold and significantly smaller range of response. The CCD offers somewhat poorer spatial resolution than the x-ray film. Comparisons of the CCD with other active x-ray detectors are also presented.

• Research Organization: Naval Research Laboratory, Washington, D.C. 20375
• OSTI ID: 7216661
• Journal Information: J. Appl. Phys.; (United States), Vol. 48:6
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
SI SEMICONDUCTOR DETECTORS
SENSITIVITY
X-RAY DETECTION
BIOMEDICAL RADIOGRAPHY
EFFICIENCY
IMAGES
INTEGRATED CIRCUITS
KEV RANGE
PHOTOSENSITIVITY
RESOLUTION
X RADIATION
DIAGNOSTIC TECHNIQUES
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
ENERGY RANGE
IONIZING RADIATIONS
MEASURING INSTRUMENTS
MEDICINE
MICROELECTRONIC CIRCUITS
NUCLEAR MEDICINE
RADIATION DETECTION
RADIATION DETECTORS
RADIATIONS
RADIOLOGY
SEMICONDUCTOR DETECTORS
440101* - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments