Extended x-ray-absorption fine-structure determination of bond-length conservation at the clean InP(110) surface

Journal Article · Thu Oct 15 00:00:00 EDT 1992 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.46.9869· OSTI ID:7162262

Woicik, J C ^[1]; Kendelewicz, T; Miyano, K E ^[2]; Richter, M ^[3]; Bouldin, C E ^[1]; Pianetta, P; Spicer, W E ^[2]

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1. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
2. Stanford Electronics Laboratory, Stanford University, Stanford, California 94305 (United States)
3. Department of Applied Physics, Stanford University, Stanford, California 94305 (United States)

Surface-sensitive extended x-ray-absorption fine structure has determined the near-neighbor bond lengths at the clean InP(110) surface. We find no change in the first-neighbor P-In bond length and a small but measurable, {similar to}0.1 A, expansion of the average P-P second-neighbor distance. Together with recent surface-sensitive x-ray standing-wave results (Woicik {ital et} {ital al}., Phys. Rev. Lett. 68, 341 (1992)), these data establish the bond-length-conserving rotation model for the nonpolar III-V semiconductor cleavage surfaces.

• DOE Contract Number: AC03-82ER13000
• OSTI ID: 7162262
• Journal Information: Physical Review, B: Condensed Matter; (United States), Vol. 46:15; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
INDIUM PHOSPHIDES
SURFACE PROPERTIES
ABSORPTION SPECTRA
BOND ANGLE
BOND LENGTHS
CLEAVAGE
X RADIATION
CRYSTAL STRUCTURE
DIMENSIONS
ELECTROMAGNETIC RADIATION
INDIUM COMPOUNDS
IONIZING RADIATIONS
LENGTH
MICROSTRUCTURE
PHOSPHIDES
PHOSPHORUS COMPOUNDS
PNICTIDES
RADIATIONS
SPECTRA
360606* - Other Materials- Physical Properties- (1992-)