Experimental study of efficiency optimization in a three-cavity gyroklystron amplifier

Journal Article · Mon Jun 01 00:00:00 EDT 1992 · IEEE Transactions on Plasma Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:7160526

Armstrong, C M; Ganguly, A K ^[1]

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1. Naval Research Lab., Washington, DC (US)

This paper reports that an experimental study quantifying the effects of both penultimate cavity tuning and magnetic field profiling on the saturated efficiency of a three-cavity gyroklystron amplifier has been performed at a frequency of 4.5 GHz. As predicted by theory, it is observed that the penultimate cavity detuning in the gyroklystron is in the opposite direction from a conventional klystron for enhanced efficiency operation. This is a result of the opposite energy dependence of the bunching mechanism for the two interactions. Magnetic field profiling has also been shown to have a very strong effect on the amplifier efficiency, both through beam loading effects in detuning the penultimate cavity and through enhanced energy extraction in the output cavity. The measured efficiency of the gyroklystron is observed to improve from 5% to 21% by profiling the magnetic field along the device, and then from 21% to 29% by penultimate cavity detuning with an optimized magnetic field profile. Comparison with theory shows reasonable agreement.

• OSTI ID: 7160526
• Journal Information: IEEE Transactions on Plasma Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 20:3; ISSN 0093-3813
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
42 ENGINEERING
KLYSTRONS
EFFICIENCY
MICROWAVE AMPLIFIERS
OPTIMIZATION
BEAM BUNCHING
CAVITIES
ENERGY DEPENDENCE
EXPERIMENT PLANNING
GHZ RANGE 01-100
MAGNETIC FIELDS
TUNING
AMPLIFIERS
BEAM DYNAMICS
ELECTRON TUBES
ELECTRONIC EQUIPMENT
EQUIPMENT
FREQUENCY RANGE
GHZ RANGE
MICROWAVE EQUIPMENT
MICROWAVE TUBES
PLANNING
440800* - Miscellaneous Instrumentation- (1990-)
426000 - Engineering- Components
Electron Devices & Circuits- (1990-)