Epitaxial KNbO[sub 3] thin films on KTaO[sub 3], MgAl[sub 2]O[sub 4], and MgO substrates
- Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695-7919 (United States)
- Oak Ridge National Laboratory, Solid State Division, Oak Ridge, Tennessee 37831-6056 (United States)
- Department of Physics, University of North Carolina, Chapel Hill, North Carolina 27599-3255 (United States)
Epitaxial potassium niobate (KNbO[sub 3]) thin films have been deposited on KTaO[sub 3] (100), MgAl[sub 2]O[sub 4] (100), and MgO (100) substrates using ion-beam sputter deposition. X-ray-diffraction results show that KNbO[sub 3] films have orthorhombic (110) orientation on all three substrates. Rutherford backscattering channeling analysis of KNbO[sub 3] films on KTaO[sub 3], MgAl[sub 2]O[sub 4], and MgO exhibits minimum scattering yields ([chi][sub min]) of 7%, 9%, and 18% for the Nb peak, respectively. This illustrates how the quality of epitaxy improves as the lattice mismatch decreases. Prism-coupling measurements reveal near-bulk refractive indices of about 2.27 for TE modes and 2.22 for TM modes for films on each substrate.
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 7149709
- Journal Information:
- Applied Physics Letters; (United States), Vol. 65:9; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
NIOBATES
EPITAXY
POTASSIUM COMPOUNDS
CRYSTAL STRUCTURE
DEPOSITION
INTERFACES
ION CHANNELING
MORPHOLOGY
REFRACTIVE INDEX
THIN FILMS
X-RAY DIFFRACTION
ALKALI METAL COMPOUNDS
CHANNELING
COHERENT SCATTERING
DIFFRACTION
FILMS
NIOBIUM COMPOUNDS
OPTICAL PROPERTIES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
REFRACTORY METAL COMPOUNDS
SCATTERING
TRANSITION ELEMENT COMPOUNDS
360201* - Ceramics
Cermets
& Refractories- Preparation & Fabrication
360204 - Ceramics
Cermets
& Refractories- Physical Properties