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Title: AFM studies of a new type of radiation defect on mica surfaces caused by highly charged ion impact

Abstract

Radiation induced defects on mica caused by the impact of slow very highly charged ions (SVHCI) have been investigated with an atomic force microscope (AFM). Freshly cleaved surfaces of different types of muscovite were irradiated with SVHCI extracted from the LLNL electron beam ion trap (EBIT) at velocities of ca. 2 keV/amu. Atomic force microscopy of the surface reveals the formation of blisterlike defects associated with single ion impact. The determined defect volume which appears to increase linearly with the incident charge state and exhibits a threshold incident charge state has been determined using the AFM. These results indicate that target atoms are subjected to mutual electrostatic repulsion due to ionization through potential electron emission upon approach of the ion. If the repulsion leads to permanent atomic displacement, surface defects are formed.

Authors:
 [1]; ;  [1]
  1. Lawrence Livermore National Lab., CA (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab., CA (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
71369
Report Number(s):
UCRL-JC-118776; CONF-941129-24
ON: DE95011536; TRN: 95:015317
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Technical Report
Resource Relation:
Conference: 13. international conference on the application of accelerators in research and industry, Denton, TX (United States), 7-10 Nov 1994; Other Information: PBD: 28 Sep 1994
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 66 PHYSICS; MUSCOVITE; PHYSICAL RADIATION EFFECTS; MULTICHARGED IONS; EXPERIMENTAL DATA; XENON IONS; KRYPTON IONS; URANIUM IONS; THORIUM IONS; BLISTERS

Citation Formats

Ruehlicke, C, Univ. Bielefeld, Briere, M A, and Schneider, D. AFM studies of a new type of radiation defect on mica surfaces caused by highly charged ion impact. United States: N. p., 1994. Web. doi:10.2172/71369.
Ruehlicke, C, Univ. Bielefeld, Briere, M A, & Schneider, D. AFM studies of a new type of radiation defect on mica surfaces caused by highly charged ion impact. United States. https://doi.org/10.2172/71369
Ruehlicke, C, Univ. Bielefeld, Briere, M A, and Schneider, D. Wed . "AFM studies of a new type of radiation defect on mica surfaces caused by highly charged ion impact". United States. https://doi.org/10.2172/71369. https://www.osti.gov/servlets/purl/71369.
@article{osti_71369,
title = {AFM studies of a new type of radiation defect on mica surfaces caused by highly charged ion impact},
author = {Ruehlicke, C and Univ. Bielefeld and Briere, M A and Schneider, D},
abstractNote = {Radiation induced defects on mica caused by the impact of slow very highly charged ions (SVHCI) have been investigated with an atomic force microscope (AFM). Freshly cleaved surfaces of different types of muscovite were irradiated with SVHCI extracted from the LLNL electron beam ion trap (EBIT) at velocities of ca. 2 keV/amu. Atomic force microscopy of the surface reveals the formation of blisterlike defects associated with single ion impact. The determined defect volume which appears to increase linearly with the incident charge state and exhibits a threshold incident charge state has been determined using the AFM. These results indicate that target atoms are subjected to mutual electrostatic repulsion due to ionization through potential electron emission upon approach of the ion. If the repulsion leads to permanent atomic displacement, surface defects are formed.},
doi = {10.2172/71369},
url = {https://www.osti.gov/biblio/71369}, journal = {},
number = ,
volume = ,
place = {United States},
year = {1994},
month = {9}
}