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Title: Development of an economical electron backscattering diffraction system for an environmental scanning electron microscope

Journal Article · · Journal of Materials Research; (United States)
 [1];  [2];  [1]
  1. Department of Nuclear Engineering, University of Michigan, Ann Arbor, Michigan 48109 (United States)
  2. North Campus Electron Microbeam Analysis Laboratory, University of Michigan, Ann Arbor, Michigan 48109 (United States)

A low cost, highly versatile electron backscattering diffraction system has been developed for an ElectroScan E3 Environmental Scanning Electron Microscope (ESEM). A P20 phosphor coated screen is placed in the microscope environment to image electron backscattering diffraction patterns (EBSPs). A CCD TV camera is used to view the patterns through a leaded glass port in the microscope specimen chamber. This system has a spatial resolution approaching 5 [mu]m and yields analyzable patterns at pressures of up to 6 Torr. With minor modifications this system may be adapted to fit any scanning electron microscope. Comparison of analyses of the grain boundary misorientation of a Ni--16Cr--9Fe alloy with this system and by selected area channeling patterns (SACPs), performed in a standard SEM, yielded excellent agreement between the two techniques. Owing to the capability to perform on-line analysis of EBSPs, the EBSP technique required only half the time as the SACP technique. The capabilities of the system are illustrated in a study of the grain boundary character distribution of Ni--16Cr--9Fe following thermomechanical treatment.

DOE Contract Number:
FG02-85ER45184
OSTI ID:
7083308
Journal Information:
Journal of Materials Research; (United States), Vol. 9:7; ISSN 0884-2914
Country of Publication:
United States
Language:
English