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Title: Molecular beam epitaxial growth of InGaAlP visible laser diodes operating at 0. 66--0. 68. mu. m at room temperatures

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.332012· OSTI ID:7048722

The room temperature pulsed operation of In/sub 0.49/Ga/sub 0.31/Al/sub 0.20/P/In/sub 0.49/Ga/sub 0.51//sub -x/ Al/sub x/P/In/sub 0.49/Ga/sub 0.31/Al/sub 0.20/P(x = 0.00--0.03) double heterostructure (DH) laser diodes have been achieved for the first time. The lasing wavelength was 0.66--0.68 ..mu..m with a threshold current density of 2.6--3.6 x 10/sup 4/A/cm/sup 2/ at 26 /sup 0/C. These results were achieved by growing DH wafers by molecular beam epitaxy (MBE). Key points in the successful MBE growth of these DH wafers were, first, the realization of low resistance p-type and n-type InGaAlP layers by reducing contamination in the growth chamber. This was done by installing a substrate loading room with an interlock valve and a substrate transfer mechanism. The second was the realization of an abrupt p-n junction by the use of Si instead of Sn as an n-type dopant.

Research Organization:
Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi-shi, Kanagawa 243-01, Japan
OSTI ID:
7048722
Journal Information:
J. Appl. Phys.; (United States), Vol. 54:12
Country of Publication:
United States
Language:
English