Extended x-ray absorption fine structure and x-ray standing wave study of the clean InP(110) surface relaxation

Journal Article · Wed Jul 01 00:00:00 EDT 1992 · Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (United States)

DOI:https://doi.org/10.1116/1.578021· OSTI ID:7039507

Woicik, J C ^[1]; Kendelewicz, T; Miyano, K E ^[2]; Cowan, P L ^[3]; Richter, M ^[4]; Karlin, B A ^[5]; Bouldin, C E ^[1]; Pianetta, P; Spicer, W E ^[2]

---

1. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
2. Stanford Electronics Laboratory, Stanford University, Stanford, California 94305 (United States)
3. Argonne National Laboratory, Chicago, Illinois 60439 (United States)
4. Department of Applied Physics, Stanford University, Stanford, California 94305 (United States)
5. National Synchrotron Light Source, Upton, New York 11973 (United States)

Through a unique combination of surface sensitive extended x-ray absorption fine structure (EXAFS) and x-ray standing waves (XSW), we have determined the pertinent structural parameters of the clean InP(110) surface reconstruction. We find a rotation angle of 27{degree} between the P--In chains, no change of the first neighbor P--In bond length, and a small but measurable, {similar to}0.1 A, expansion of the average P--P second neighbor distance. The general application of the EXAFS and XSW techniques to the study of clean surfaces will be discussed.

• DOE Contract Number: AC02-76CH00016
• OSTI ID: 7039507
• Journal Information: Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (United States), Vol. 10:4; ISSN 0734-2101
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
INDIUM PHOSPHIDES
SURFACE PROPERTIES
CHEMICAL BONDS
RELAXATION
STANDING WAVES
X RADIATION
ELECTROMAGNETIC RADIATION
INDIUM COMPOUNDS
IONIZING RADIATIONS
PHOSPHIDES
PHOSPHORUS COMPOUNDS
PNICTIDES
RADIATIONS
360602* - Other Materials- Structure & Phase Studies