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Title: Chemistry of radiation damage to wire chambers

Technical Report ·
DOI:https://doi.org/10.2172/7035484· OSTI ID:7035484

Proportional counters are used to study aspects of radiation damage to wire chambers (wire aging). Principles of low-pressure, rf plasma chemistry are used to predict the plasma chemistry in electron avalanches (1 atm, dc). (1) Aging is studied in CF{sub 4}/iC{sub 4}H{sub 10} gas mixtures. Wire deposits are analyzed by Auger electron spectroscopy. An apparent cathode aging process resulting in loss of gain rather than in a self-sustained current is observed in CF{sub 4}-rich gases. A four-part model considering plasma polymerization of the hydrocarbon, etching of wire deposits by CF{sub 4}, acceleration of deposition processes in strongly etching environments, and reactivity of the wire surface is developed to understand anode wire aging in CF{sub 4}/iC{sub 4}H{sub 10} gases. Practical guidelines suggested by the model are discussed. (2) Data are presented to suggest that trace amounts of Freons do not affect aging rates in either dimethyl ether or Ar/C{sub 2}H{sub 6}. Apparent loss of gain is explained by attachment of primary electrons to a continuously increasing concentration of Freon 11 (CCl{sub 3}F) in the counter gas. An increase in the concentration of Freon 11 in dimethyl ether is caused by a distillation process in the gas supply bottle and is a natural consequence of the unequal volatilities of the two compounds.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
7035484
Report Number(s):
LBL-32500; ON: DE93000627
Resource Relation:
Other Information: Thesis (Ph.D.)
Country of Publication:
United States
Language:
English