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Title: Nondestructive testing for microelectronics, semiconductors, and superconductors. (Latest citations from the Aerospace database). Published Search

Abstract

The bibliography contains citations concerning the theory and various techniques for nondestructive testing or examination of microelectronic devices, semiconductor devices, and superconductors for the detection of flaws or defects which affect their properties and behavior. Some attention is also given to uniformity and quality control in integrated circuit manufacturing. (Contains a minimum of 61 citations and includes a subject term index and title list.)

Publication Date:
Research Org.:
NERAC, Inc., Tolland, CT (United States)
OSTI Identifier:
7032560
Alternate Identifier(s):
OSTI ID: 7032560
Report Number(s):
PB-94-882685/XAB
Resource Type:
Technical Report
Resource Relation:
Other Information: Updated with each order. Supersedes PB--93-883627
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; SEMICONDUCTOR DEVICES; NONDESTRUCTIVE TESTING; SUPERCONDUCTORS; BIBLIOGRAPHIES; INTEGRATED CIRCUITS; MICROELECTRONICS; DOCUMENT TYPES; ELECTRONIC CIRCUITS; MATERIALS TESTING; MICROELECTRONIC CIRCUITS; TESTING 665412* -- Superconducting Devices-- (1992-)

Citation Formats

Not Available. Nondestructive testing for microelectronics, semiconductors, and superconductors. (Latest citations from the Aerospace database). Published Search. United States: N. p., 1994. Web.
Not Available. Nondestructive testing for microelectronics, semiconductors, and superconductors. (Latest citations from the Aerospace database). Published Search. United States.
Not Available. Sun . "Nondestructive testing for microelectronics, semiconductors, and superconductors. (Latest citations from the Aerospace database). Published Search". United States. doi:.
@article{osti_7032560,
title = {Nondestructive testing for microelectronics, semiconductors, and superconductors. (Latest citations from the Aerospace database). Published Search},
author = {Not Available},
abstractNote = {The bibliography contains citations concerning the theory and various techniques for nondestructive testing or examination of microelectronic devices, semiconductor devices, and superconductors for the detection of flaws or defects which affect their properties and behavior. Some attention is also given to uniformity and quality control in integrated circuit manufacturing. (Contains a minimum of 61 citations and includes a subject term index and title list.)},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun May 01 00:00:00 EDT 1994},
month = {Sun May 01 00:00:00 EDT 1994}
}

Technical Report:
Other availability
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