Simulation of heavy charged particle tracks using focused laser beams

Conference · Tue Dec 01 00:00:00 EST 1987 · IEEE Trans. Nucl. Sci.; (United States)

OSTI ID:7031591

Richter, A K; Arimura, I

A laboratory system utilizing a Q-switched Nd-doped YAG laser is used to simulate the ionization track produced as energetic heavy ions traverse a semiconductor device (resulting in single-event upset effects). Details of the optical design for producing the precisely focused spot and the requirements for fast pulses are described. The advantages and disadvantages of the use of this laboratory simulation are discussed. Laser tests on PIN diodes, p-n junctions, bipolar memories, and power MOSFETs are described and compared to high energy particle tests results.

• Research Organization: Boeing Aerospace Co., P.O. Box 3999, Seattle, WA (US)
• OSTI ID: 7031591
• Report Number(s): CONF-8707112-; TRN: 88-025501
• Journal Information: IEEE Trans. Nucl. Sci.; (United States), Vol. NS-34:6; Conference: Annual conference on nuclear and space radiation effects, Snowmass Village, CO, USA, 28 Jul 1987
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
43 PARTICLE ACCELERATORS
42 ENGINEERING
HEAVY IONS
PARTICLE TRACKS
MOSFET
PERFORMANCE TESTING
P-N JUNCTIONS
CHARGED PARTICLE DETECTION
DESIGN
FAST MAGNETOACOUSTIC WAVES
IONIZATION
LASER BEAM MACHINING
NEODYMIUM LASERS
SEMICONDUCTOR LASERS
SIMULATION
CHARGED PARTICLES
DETECTION
FIELD EFFECT TRANSISTORS
HYDROMAGNETIC WAVES
IONS
JUNCTIONS
LASERS
MACHINING
MAGNETOACOUSTIC WAVES
MOS TRANSISTORS
RADIATION DETECTION
SEMICONDUCTOR DEVICES
SEMICONDUCTOR JUNCTIONS
SOLID STATE LASERS
TESTING
TRANSISTORS
360605* - Materials- Radiation Effects
440104 - Radiation Instrumentation- High Energy Physics Instrumentation
430301 - Particle Accelerators- Ion Sources
420300 - Engineering- Lasers- (-1989)