Backscatter from metal surfaces in diagnostic radiology

Journal Article · Sun Jan 01 00:00:00 EST 1984 · Radiology; (United States)

DOI:https://doi.org/10.1148/radiology.150.1.6689765· OSTI ID:7014816

Kodera, Y; Schmidt, R A; Chan, H P; Doi, K

Backscatter from four commonly used metals (aluminum, lead, copper, and iron) was measured under diagnostic imaging conditions, using screen-film systems as detectors. The results indicate that for an 80-kV filtered beam and Par Speed/XRP system, backscatter increases as aluminum (Al) thickness increases until it reaches a plateau of approximately 12% at 50 mm Al. The amount of backscatter from any of these four metals increases as the tube voltage is raised from 60 to 115 kV. Measured backscatter depends strongly on the screens used, possibly due to their attenuation and energy response. Backscatter from aluminum was significantly greater than that from the other metals tested.

• Research Organization: Univ. of Chicago, IL
• OSTI ID: 7014816
• Journal Information: Radiology; (United States), Vol. 150:1
• Country of Publication: United States
• Language: English

Related Subjects

62 RADIOLOGY AND NUCLEAR MEDICINE
ALUMINIUM
RADIATION SCATTERING ANALYSIS
BACKSCATTERING
MEASURING METHODS
COPPER
IRON
LEAD
X RADIATION
BIOMEDICAL RADIOGRAPHY
CHEMICAL ANALYSIS
DIAGNOSTIC TECHNIQUES
ELECTROMAGNETIC RADIATION
ELEMENTS
IONIZING RADIATIONS
MEDICINE
METALS
NONDESTRUCTIVE ANALYSIS
NUCLEAR MEDICINE
RADIATIONS
RADIOLOGY
SCATTERING
TRANSITION ELEMENTS
550602* - Medicine- External Radiation in Diagnostics- (1980-)