Absolute cross-section measurements for electron-impact single ionization of Si[sup 4+] and Si[sup 5+]

Journal Article · Mon Aug 01 00:00:00 EDT 1994 · Physical Review A; (United States)

DOI:https://doi.org/10.1103/PhysRevA.50.1377· OSTI ID:7014705

Thompson, J S ^[1]; Gregory, D C ^[2]

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1. Joint Institute for Laboratory Astrophysics of the University of Colorado and the National Institute for Standards and Technology, Boulder, Colorado 80309-0440 (United States)
2. Physics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6372 (United States)

Experimental measurements of absolute cross sections are presented for electron-impact single ionization of Si[sup 4+] and Si[sup 5+]. The incident electron energies range from below threshold to 1500 eV. The measurements were performed using the crossed ion-electron beams apparatus at the Oak Ridge National Laboratory Electron-Cyclotron Resonance Ion-Source Facility. The data are in reasonable agreement with cross sections calculated using the Lotz semiempirical formula. Reduced cross sections for the isoelectronic targets, Si[sup 4+] and Ar[sup 8+], are compared in order to test classical scaling for direct electron-impact single ionization.

• DOE Contract Number: AI05-86ER53237; AC05-84OR21400
• OSTI ID: 7014705
• Journal Information: Physical Review A; (United States), Vol. 50:2; ISSN 1050-2947
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
SILICON
ELECTRON-ION COLLISIONS
ARGON
COMPARATIVE EVALUATIONS
CROSS SECTIONS
IONIZATION
ISOELECTRONIC ATOMS
KEV RANGE
MULTICHARGED IONS
SCALING LAWS
SILICON IONS
ATOMS
CHARGED PARTICLES
COLLISIONS
ELECTRON COLLISIONS
ELEMENTS
ENERGY RANGE
EVALUATION
FLUIDS
GASES
ION COLLISIONS
IONS
NONMETALS
RARE GASES
SEMIMETALS
664300* - Atomic & Molecular Physics- Collision Phenomena- (1992-)