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Title: Backscatter from metal surfaces in diagnostic radiology

Journal Article · · Radiology; (United States)

Backscatter from four commonly used metals (aluminum, lead, copper, and iron) was measured under diagnostic imaging conditions, using screen-film systems as detectors. The results indicate that for an 80-kV filtered beam and Par Speed/XRP system, backscatter increases as aluminum (Al) thickness increases until it reaches a plateau of approximately 12% at 50 mm Al. The amount of backscatter depends strongly on the screen used, possibly due to their attenuation and energy response. Backscatter from aluminum was significantly greater than that from the other metals tested.

Research Organization:
Univ. of Chicago, IL
OSTI ID:
7014677
Journal Information:
Radiology; (United States), Vol. 150:1
Country of Publication:
United States
Language:
English