Temperature dependence of the first sharp diffraction peak in vitreous silica

Conference · Sun Apr 01 00:00:00 EST 1990

OSTI ID:7001125

Moen, L K; Montague, D G ^[1]; Susman, S; Volin, K J; Price, D L ^[2]

---

1. Willamette Univ., Salem, OR (USA)
2. Argonne National Lab., IL (USA)

Diffraction measurements on glasses often generate a structure factor with a prominent first sharp diffraction peak (FSDP). A temperature dependent change in the FSDP is most often attributed to two competing effects. Reduced frustration arising from a lower density tends to increase the intensity and decrease the width, while thermal vibrations tend to decrease the intensity and increase the width. In covalent glasses, the FSDP typically broadens and decreases in height with increasing temperature. Most oxide and chalcogenide glasses display a reversibly increasing FSDP with increasing temperature. Although vitreous silica (SiO{sub 2}) has been extensively researched, only Soklakov et al. have investigated its structure factor at elevated temperatures. They concluded that the temperature dependence of the FSDP (observed in x-ray diffraction patterns) was comparable to other oxide and chalcogenide glasses. Vitreous SiO{sub 2}, however, has an extremely small coefficient of thermal expansion (0.55 {times} 10{sup {minus}6}cm/cm C{degree}). Consequently its density varies little with temperature and an increase in the intensity of its FSDP is not expected. The purpose of this study is to determine the temperature dependence of the FSDP in vitreous silica using modern methods of neutron scattering. 9 refs., 1 fig., 2 tabs.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: DOE/ER
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 7001125
• Report Number(s): CONF-9004186-2; ON: DE90011181
• Resource Relation: Conference: 4. national undergraduate resesearch conference, Schenectady, NY (USA), 19-21 Apr 1990
• Country of Publication: United States
• Language: English

Related Subjects

73 NUCLEAR PHYSICS AND RADIATION PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE
NEUTRON DIFFRACTION
TEMPERATURE DEPENDENCE
SILICA
DENSITY
GLASS
STRUCTURE FACTORS
TIME-OF-FLIGHT METHOD
CHALCOGENIDES
COHERENT SCATTERING
DIFFRACTION
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
SCATTERING
SILICON COMPOUNDS
SILICON OXIDES
654003* - Radiation & Shielding Physics- Neutron Interactions with Matter
656003 - Condensed Matter Physics- Interactions between Beams & Condensed Matter- (1987-)
360204 - Ceramics
Cermets
& Refractories- Physical Properties