Characteristics of hydrogenated amorphous silicon-germanium alloys
- Solar Energy Research Institute, Golden, CO (USA)
Data in the literature are summarized for hydrogenated amorphous silicon-germanium (a-SiGe:H and a-SiGe:H:F) alloys that show the relation between germanium content, hydrogen content, deposition methods, feed-gas mixture, and other deposition parameters, and properties such as the optical band gap, dark and photoconductivities, photosensitivity, Urbach parameter, and spin density. Examining RF glow discharge with both a diode and a triode geometry, DC proximity glow discharge, and photochemical vapor deposition (photo-CVD), using various hydrogen-diluted and undiluted gas mixtures, one observes that hydrogen (or inert gas) dilution is essential for obtaining high photosensitivity in SiGe alloys (in contradistinction to a-Si:H). Hydrogen dilution results in about an order of magnitude higher photosensitivity in a-SiGe:H than do undiluted gas mixtures. Aside from hydrogen dilution, neither the gas mixture nor the deposition method (various glow discharges or photo-CVD) appears to affect the photosensitivity of SiGe alloy films with optical band gaps of approximately 1.5 eV.
- DOE Contract Number:
- AC02-83CH10093
- OSTI ID:
- 6990264
- Journal Information:
- Applied Physics Communications; (USA), Vol. 9:1-2; ISSN 0277-9374
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
GERMANIUM ALLOYS
PHYSICAL PROPERTIES
SILICON ALLOYS
DATA ANALYSIS
EXPERIMENTAL DATA
HYDROGENATION
MEASURING INSTRUMENTS
MEASURING METHODS
SEMICONDUCTOR MATERIALS
ALLOYS
CHEMICAL REACTIONS
DATA
INFORMATION
MATERIALS
NUMERICAL DATA
360000* - Materials
360600 - Other Materials
360603 - Materials- Properties