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Title: Fundamental studies of M-S and MIS solar cells on polycrystalline silicon. Final report, January 1, 1979-June 30, 1980. [Theoretical and experimental studies]

Technical Report ·
OSTI ID:6931977

A new technique plotting the open-circuit voltage vs short-circuit current at varying illumination intensity is found to provide a better description of the solar cells when the n-value reflects the electrostatic potential drop across the interface layer in MIS structures. The majority carrier MIS cell (e.g., Au-SiO/sub 2/-nS) has been found to be less sensitive to the parameters of the oxide layer, but to have a somewhat lower efficiency than the minority-carrier cell (e.g., Al-SiO/sub 2/-pS). The tunneling barriers for holes are found to be consistently much larger than those for electrons. Experimental I-V and C-V characteristics of Schottky diodes with variable grain sizes have been measured. Analysis of the data indicate that the transport may be electrode-limited or bulk-limited depending on the average grain size. In addition, minority carrier injection dominates the dark current for sufficiently small grain size and large grain-boundary (GB) mismatch angle. Al-poly-Si Schottky-barrier diodes were fabricated on Wacker polycrystalline wafers. By examining the surface features of diodes on the same substrate, it was found that the high-angle grain boundary, distinguished by different etch pits on the two adjacent grains, has a strong influence on the current-voltage and low-frequency capacitance characteristics of the diode. A technology of forming Schottky barriers with high barrier height (0.93 eV) and low reverse saturation current (10/sup -5/ A/cm/sup 2/) was developed.

Research Organization:
Columbia Univ., New York (USA); Solar Energy Research Inst., Golden, CO (USA)
DOE Contract Number:
AC03-79ET23049
OSTI ID:
6931977
Report Number(s):
DOE/ET/23049-T1
Country of Publication:
United States
Language:
English