Analysis of the phase-amplitude coupling factor and spectral linewidth of distributed feedback and composite-cavity semiconductor lasers
- Ecole Nationale Superieure des Telecommunications, 75634 Cedex (FR)
The method for the analysis of semiconductor lasers based on a Green's function approach is developed in a form suitable for complex-cavity structures. Besides the spontaneous emission rate, the effective phase-amplitude coupling factor can also be accurately evaluated. The application of this method to distributed feedback (DFB) and composite-cavity lasers gives interesting new results. For DFB lasers, the spontaneous emission rate is strongly dependent on both the facet reflectivities and the grating coupling coefficient. The effective phase-amplitude coupling factor depends on the wavelength detuning from the gain maximum. The calculated linewidth of DFB lasers differs considerably from previous results and gives a better agreement with reported experimental results. For composite-cavity lasers, the frequency dependence of the equivalent reflectivity has a strong impact on the phase-amplitude coupling factor and the spontaneous emission rate. Distributed Bragg reflector (DBR) lasers are investigated as an example of a composite-cavity structure. An optimum grating coupling coefficient in the Bragg region is found which minimizes the spectral linewidth. Negative detuning from the Bragg frequency results in low phase-amplitude coupling factor and narrow spectral linewidth. This method is also useful for lasers with multiple active sections.
- OSTI ID:
- 6923403
- Journal Information:
- IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (USA), Vol. 26:1; ISSN 0018-9197
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
47 OTHER INSTRUMENTATION
LASER CAVITIES
DESIGN
SEMICONDUCTOR LASERS
PERFORMANCE TESTING
BRAGG REFLECTION
DIFFRACTION GRATINGS
GAIN
GREEN FUNCTION
PHASE SHIFT
REFLECTIVITY
SPECTRAL DENSITY
AMPLIFICATION
FUNCTIONS
GRATINGS
LASERS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
REFLECTION
SEMICONDUCTOR DEVICES
SOLID STATE LASERS
SPECTRAL FUNCTIONS
SURFACE PROPERTIES
TESTING
426002* - Engineering- Lasers & Masers- (1990-)
440600 - Optical Instrumentation- (1990-)