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Title: Design, analysis, and test verification of advanced encapsulation systems. Triannual report for period ending 31 July 1982

Technical Report ·
DOI:https://doi.org/10.2172/6891390· OSTI ID:6891390

The beginning of work on the construction of qualification encapsulated solar cells is reported. A computer study of the sensitivity of module power output to the indices of refraction of the covering, antireflection coating, and pottant is presented. Tables were generated for plain silicon, texturized non-antireflection coated silicon, plain antireflection coated silicon with coating indices of refraction of 2.0, 2.2, 2.4, 2.6, 2.8, and 3.0 and texturized antireflection coated silicon with coating indices of refraction of 2.0, 2.2, 2.4, 2.6, 2.8, and 3.0. (LEW)

Research Organization:
Spectrolab, Inc., Sylmar, CA (USA)
DOE Contract Number:
NAS-7-100-955567
OSTI ID:
6891390
Report Number(s):
DOE/JPL/955567-82/9; ON: DE83004843
Country of Publication:
United States
Language:
English