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Title: Quantitative powder x-ray diffractometry phase analysis of silicon nitride materials by a multiline, mean-normalized-intensity method

Abstract

A general purpose multiline, mean-normalized-intensity (MNI) method, derived from a procedure proposed in the literature, was applied to phase-composition analysis of powders containing [alpha]- and [beta]-silicon nitride and small amounts of free silicon. Results obtained using peak and integrated intensities to derive the MNI values for the phases were compared with values determined by Rietveld pattern fitting according to error assessments based on the MNI standard deviation estimates calculated by assuming that the MNI data for each phase follow Gaussian statistics, and Rietveld-derived standard deviations. The MNI results for the integrated intensities agreed reasonably with the Rietveld determinations and were discernibly superior to results obtained with peak intensities. The study demonstrated the power of the MNI method as a general tool for materials analysis.

Authors:
; ; ;  [1]
  1. Curtin Univ. of Technology, Perth (Australia). Dept. of Applied Physics
Publication Date:
OSTI Identifier:
6889251
Resource Type:
Journal Article
Journal Name:
Journal of the American Ceramic Society; (United States)
Additional Journal Information:
Journal Volume: 77:8; Journal ID: ISSN 0002-7820
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; SILICON NITRIDES; PHASE STUDIES; BRAGG REFLECTION; COMPARATIVE EVALUATIONS; DIAGNOSTIC TECHNIQUES; EVALUATION; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; REFLECTION; SILICON COMPOUNDS; 360202* - Ceramics, Cermets, & Refractories- Structure & Phase Studies

Citation Formats

Li, D Y, O'Connor, B H, Chen, Q T, and Zadnik, M G. Quantitative powder x-ray diffractometry phase analysis of silicon nitride materials by a multiline, mean-normalized-intensity method. United States: N. p., 1994. Web. doi:10.1111/j.1151-2916.1994.tb07118.x.
Li, D Y, O'Connor, B H, Chen, Q T, & Zadnik, M G. Quantitative powder x-ray diffractometry phase analysis of silicon nitride materials by a multiline, mean-normalized-intensity method. United States. https://doi.org/10.1111/j.1151-2916.1994.tb07118.x
Li, D Y, O'Connor, B H, Chen, Q T, and Zadnik, M G. Mon . "Quantitative powder x-ray diffractometry phase analysis of silicon nitride materials by a multiline, mean-normalized-intensity method". United States. https://doi.org/10.1111/j.1151-2916.1994.tb07118.x.
@article{osti_6889251,
title = {Quantitative powder x-ray diffractometry phase analysis of silicon nitride materials by a multiline, mean-normalized-intensity method},
author = {Li, D Y and O'Connor, B H and Chen, Q T and Zadnik, M G},
abstractNote = {A general purpose multiline, mean-normalized-intensity (MNI) method, derived from a procedure proposed in the literature, was applied to phase-composition analysis of powders containing [alpha]- and [beta]-silicon nitride and small amounts of free silicon. Results obtained using peak and integrated intensities to derive the MNI values for the phases were compared with values determined by Rietveld pattern fitting according to error assessments based on the MNI standard deviation estimates calculated by assuming that the MNI data for each phase follow Gaussian statistics, and Rietveld-derived standard deviations. The MNI results for the integrated intensities agreed reasonably with the Rietveld determinations and were discernibly superior to results obtained with peak intensities. The study demonstrated the power of the MNI method as a general tool for materials analysis.},
doi = {10.1111/j.1151-2916.1994.tb07118.x},
url = {https://www.osti.gov/biblio/6889251}, journal = {Journal of the American Ceramic Society; (United States)},
issn = {0002-7820},
number = ,
volume = 77:8,
place = {United States},
year = {1994},
month = {8}
}