Influence of ac contact impedance on high-frequency, low-temperature, or fast-transient junction measurements in semiconductors

Journal Article · Sun Feb 15 00:00:00 EST 1987 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.338090· OSTI ID:6882908

Shiau, J; Fahrenbruch, A L; Bube, R H

The behavior of a semiconductor contact is usually represented by the specific contact resistance determined by a dc measurement. A copper-gold contact on p-type cadmium telluride is used to illustrate the influence of the ac contact impedance on standard semiconductor measurements such as capacitance versus voltage, admittance spectroscopy, and deep-level transient spectroscopy. These experimental results show that a semiconductor contact with negligible dc voltage drop may have a significant influence on high-frequency, low-temperature, or fast-transient measurements. Knowledge of the contact capacitance as well as the contact resistance is necessary to predict the influence of the contact.

• Research Organization: Department of Materials Science and Engineering, Stanford University, Stanford, California 94305
• OSTI ID: 6882908
• Journal Information: J. Appl. Phys.; (United States), Vol. 61:4
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
42 ENGINEERING
CADMIUM TELLURIDES
ELECTRIC CONTACTS
ELECTRIC IMPEDANCE
COPPER
GOLD
DEEP LEVEL TRANSIENT SPECTROSCOPY
SEMICONDUCTOR JUNCTIONS
CADMIUM COMPOUNDS
CHALCOGENIDES
ELECTRICAL EQUIPMENT
ELEMENTS
EQUIPMENT
IMPEDANCE
JUNCTIONS
METALS
SPECTROSCOPY
TELLURIDES
TELLURIUM COMPOUNDS
TRANSITION ELEMENTS
360603* - Materials- Properties
420800 - Engineering- Electronic Circuits & Devices- (-1989)