Reptation dynamics of a polymer melt near an attractive solid interface
- Department of Materials Science, SUNY at Stony Brook, Stony Brook, New York 11974 (United States) E.I. DuPont de Nemours and Company, Inc., Experimental Station, Wilmington, Delaware 19880 (United States) Physics Department, Queens College, Flushing, New York 11367 (United States) Imaging Research and Advanced Development, Eastman Kodak Company, Rochester, New York 14650 (United States)
The tracer diffusion coefficients [ital D][sup *] of polystyrene (PS) chains near PS melt-solid interfaces have been measured by secondary ion mass spectrometry. The [ital D][sup *] for poly(2--vinylpyridine) (PVP) and oxide (SiO) covered silicon surfaces were smaller by, respectively, [similar to]3 and [similar to]10[sup 2] than for diffusion near the vacuum interface. [ital D][sup *] scaled with degree of polymerization [ital N] as [ital N][sup [minus][proportional to]], with [alpha][sub PVP]=1.7(1) and [alpha][sub SiO]=1.5(1). These results are in excellent agreement with reptation theory modified to account for increased friction due to surface-monomer contacts. The monomeric friction coefficients were found to be 98[plus minus]13 (PVP) and 5750[plus minus]450 (SiO) times greater than the bulk melt values.
- DOE Contract Number:
- FG02-93ER45481
- OSTI ID:
- 6880216
- Journal Information:
- Physical Review Letters; (United States), Vol. 74:3; ISSN 0031-9007
- Country of Publication:
- United States
- Language:
- English
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Final report for grant: DE-FG02-93ER45481 [Polymers at engineered interfaces]
Related Subjects
POLYSTYRENE
SURFACE PROPERTIES
DIFFUSION
DYNAMICS
FILMS
INTERFACES
MASS SPECTROSCOPY
POLYMERIZATION
CHEMICAL REACTIONS
MATERIALS
MECHANICS
ORGANIC COMPOUNDS
ORGANIC POLYMERS
PETROCHEMICALS
PETROLEUM PRODUCTS
PLASTICS
POLYMERS
POLYOLEFINS
POLYVINYLS
SPECTROSCOPY
SYNTHETIC MATERIALS
360606* - Other Materials- Physical Properties- (1992-)