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Title: Spectral dependence of point defect production by x rays in RbBr

Abstract

{ital F}-center formation by monochromatic x rays has been studied above and below the bromine and rubidium {ital K}-absorption edges in crystals of RbBr. The x-ray beam from a double silicon crystal monochromator on an undulator at the Advanced Photon Source was used to produce these point defects, which were detected by a sensitive laser-induced luminescence method. Experiments were carried out over a wide range of monochromatic x-ray intensity, with emphasis on the nearly linear initial slope of defect formation with exposure. No significant increase in {ital F}-center formation efficiency was found upon crossing the bromine {ital K} edge, which indicates that additional Auger-cascade mechanisms do not appreciably add to the usual multiple ionization electron-hole recombination processes known to generate point defects. {copyright} {ital 1999} {ital The American Physical Society}

Authors:
 [1];  [2];  [3]; ; ;  [1]
  1. Department of Physics, University of Washington, Box 351560, Seattle, Washington 98195 (United States)
  2. Pacific Northwest Laboratory, ANL-APS, Argonne, Illinois 60439 (United States)
  3. Department of Physics, Simon Fraser University, Burnaby, British Columbia (Canada)
Publication Date:
OSTI Identifier:
686445
Resource Type:
Journal Article
Journal Name:
Physical Review, B: Condensed Matter
Additional Journal Information:
Journal Volume: 60; Journal Issue: 10; Other Information: PBD: Sep 1999
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; RHODIUM COMPOUNDS; POINT DEFECTS; SPECTRAL RESPONSE; RUBIDIUM BROMIDES; F CENTERS; K ABSORPTION; AUGER EFFECT

Citation Formats

Brown, F.C., Heald, S.M., Jiang, D., Brewe, D.L., Kim, K.H., and Stern, E.A. Spectral dependence of point defect production by x rays in RbBr. United States: N. p., 1999. Web. doi:10.1103/PhysRevB.60.7037.
Brown, F.C., Heald, S.M., Jiang, D., Brewe, D.L., Kim, K.H., & Stern, E.A. Spectral dependence of point defect production by x rays in RbBr. United States. doi:10.1103/PhysRevB.60.7037.
Brown, F.C., Heald, S.M., Jiang, D., Brewe, D.L., Kim, K.H., and Stern, E.A. Wed . "Spectral dependence of point defect production by x rays in RbBr". United States. doi:10.1103/PhysRevB.60.7037.
@article{osti_686445,
title = {Spectral dependence of point defect production by x rays in RbBr},
author = {Brown, F.C. and Heald, S.M. and Jiang, D. and Brewe, D.L. and Kim, K.H. and Stern, E.A.},
abstractNote = {{ital F}-center formation by monochromatic x rays has been studied above and below the bromine and rubidium {ital K}-absorption edges in crystals of RbBr. The x-ray beam from a double silicon crystal monochromator on an undulator at the Advanced Photon Source was used to produce these point defects, which were detected by a sensitive laser-induced luminescence method. Experiments were carried out over a wide range of monochromatic x-ray intensity, with emphasis on the nearly linear initial slope of defect formation with exposure. No significant increase in {ital F}-center formation efficiency was found upon crossing the bromine {ital K} edge, which indicates that additional Auger-cascade mechanisms do not appreciably add to the usual multiple ionization electron-hole recombination processes known to generate point defects. {copyright} {ital 1999} {ital The American Physical Society}},
doi = {10.1103/PhysRevB.60.7037},
journal = {Physical Review, B: Condensed Matter},
number = 10,
volume = 60,
place = {United States},
year = {1999},
month = {9}
}