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Title: Structure determination of a planar defect in SrBi{sub 2}Ta{sub 2}O{sub 9}

Abstract

The atomic structure of a planar defect with a (001) habit plane in single crystal layered perovskite SrBi{sub 2}Ta{sub 2}O{sub 9} is determined by high-resolution {ital Z}-contrast imaging. We found that the defect forms a structure, with two Sr{endash}Ta{endash}O perovskite blocks connected by a metallic Sr{sub 2} plane, rather than a Bi{sub 2}O{sub 2} layer as in the perfect crystal. This defect is expected to be an efficient hole trap and may have important implications for the electronic properties and the ferroelectric response of the SrBi{sub 2}Ta{sub 2}O{sub 9} material. {copyright} {ital 1999 American Institute of Physics.}

Authors:
;  [1]; ; ; ;  [2];  [3]
  1. National Renewable Energy Laboratory, Golden, Colorado 80401 (United States)
  2. Department of Materials Science and Engineering, University of Illinois, Urbana, Illinois 61801 (United States)
  3. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
Publication Date:
OSTI Identifier:
686433
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 75; Journal Issue: 13; Other Information: PBD: Sep 1999
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 66 PHYSICS; STRONTIUM COMPOUNDS; BISMUTH COMPOUNDS; STRONTIUM OXIDES; BISMUTH OXIDES; TANTALATES; CRYSTAL DEFECTS; MICROSTRUCTURE; PEROVSKITE; STRUCTURAL CHEMICAL ANALYSIS; X-RAY DIFFRACTION; ELECTRON DIFFRACTION; FERROELECTRIC MATERIALS

Citation Formats

Yan, Y., Al-Jassim, M.M., Xu, Z., Lu, X., Viehland, D., Payne, M., and Pennycook, S.J. Structure determination of a planar defect in SrBi{sub 2}Ta{sub 2}O{sub 9}. United States: N. p., 1999. Web. doi:10.1063/1.124885.
Yan, Y., Al-Jassim, M.M., Xu, Z., Lu, X., Viehland, D., Payne, M., & Pennycook, S.J. Structure determination of a planar defect in SrBi{sub 2}Ta{sub 2}O{sub 9}. United States. doi:10.1063/1.124885.
Yan, Y., Al-Jassim, M.M., Xu, Z., Lu, X., Viehland, D., Payne, M., and Pennycook, S.J. Wed . "Structure determination of a planar defect in SrBi{sub 2}Ta{sub 2}O{sub 9}". United States. doi:10.1063/1.124885.
@article{osti_686433,
title = {Structure determination of a planar defect in SrBi{sub 2}Ta{sub 2}O{sub 9}},
author = {Yan, Y. and Al-Jassim, M.M. and Xu, Z. and Lu, X. and Viehland, D. and Payne, M. and Pennycook, S.J.},
abstractNote = {The atomic structure of a planar defect with a (001) habit plane in single crystal layered perovskite SrBi{sub 2}Ta{sub 2}O{sub 9} is determined by high-resolution {ital Z}-contrast imaging. We found that the defect forms a structure, with two Sr{endash}Ta{endash}O perovskite blocks connected by a metallic Sr{sub 2} plane, rather than a Bi{sub 2}O{sub 2} layer as in the perfect crystal. This defect is expected to be an efficient hole trap and may have important implications for the electronic properties and the ferroelectric response of the SrBi{sub 2}Ta{sub 2}O{sub 9} material. {copyright} {ital 1999 American Institute of Physics.}},
doi = {10.1063/1.124885},
journal = {Applied Physics Letters},
number = 13,
volume = 75,
place = {United States},
year = {1999},
month = {9}
}