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Title: Multiple-phase flowmeter and materials analysis apparatus and method

Patent ·
OSTI ID:6858572

An apparatus and method for elemental analysis and non-invasive measurement of the mass flow rate and/or density distribution of a multiple-phase system. The apparatus includes at least two x-ray sources, transmission detectors for the x-ray sources, fluorescence detectors, and collimators all of which are suitably indexed and multiplexed to provide information corresponding to the density distribution, elemental composition, phase composition, and/or flow rate of the system. Energy selective detectors are included in the apparatus to provide selective fluorescent radiation detection for fluorescence emitted by elements excited by the x-rays as a technique for obtaining an indication of the elemental composition of the system. X-ray sources and transmitted x-ray detectors are used to detect the density of the multiple-phase system at each point in a crosssection of the system. Corresponding second x-ray sources and detectors are mounted a moderately short distance from the first x-ray source and detector combination. The total mass flow rate and density distribution of the system is the integral over the area of the conduit for a plurality of point mass transfer rates and densities. A conventional computer system is included as part of the flowmeter and materials analysis apparatus to correlate and process the readings obtained by the various detectors and obtain thereby the mass flow rate, density and elemental composition of the multiple-phase system.

Assignee:
IFI; EDB-81-049199
Patent Number(s):
US 4228353
OSTI ID:
6858572
Resource Relation:
Patent File Date: Filed date 2 May 1978
Country of Publication:
United States
Language:
English