skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Atom probe microanalysis and nanoscale microstructures in metallic materials

Abstract

An atom probe field ion microscope (APFIM) is a unique microanalytical instrument with a single atom detection sensitivity. By employing a three-dimensional atom probe (3DAP), alloying elements can be mapped out in a three-dimensional space with near-atomic resolution. APFIM is particularly useful for the analysis of solute clusters and small precipitate particles, because it can collect atoms exclusively from nanoscale particles embedded in a matrix. These features are suitable for characterizing the complicated microstructures in commercial metallic materials. Recent atom probe investigations on the nanoscale microstructures of the metallic materials are overviewed to demonstrate the unique feature of the APFIM technique.

Authors:
 [1]
  1. National Research Institute for Metals, Tsukuba (Japan)
Publication Date:
OSTI Identifier:
684374
Resource Type:
Journal Article
Journal Name:
Acta Materialia
Additional Journal Information:
Journal Volume: 47; Journal Issue: 11; Other Information: PBD: 8 Sep 1999
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; MICROSTRUCTURE; METALS; MICROANALYSIS; ION MICROSCOPY; PRECIPITATION; PHASE TRANSFORMATIONS

Citation Formats

Hono, K. Atom probe microanalysis and nanoscale microstructures in metallic materials. United States: N. p., 1999. Web. doi:10.1016/S1359-6454(99)00175-5.
Hono, K. Atom probe microanalysis and nanoscale microstructures in metallic materials. United States. doi:10.1016/S1359-6454(99)00175-5.
Hono, K. Wed . "Atom probe microanalysis and nanoscale microstructures in metallic materials". United States. doi:10.1016/S1359-6454(99)00175-5.
@article{osti_684374,
title = {Atom probe microanalysis and nanoscale microstructures in metallic materials},
author = {Hono, K.},
abstractNote = {An atom probe field ion microscope (APFIM) is a unique microanalytical instrument with a single atom detection sensitivity. By employing a three-dimensional atom probe (3DAP), alloying elements can be mapped out in a three-dimensional space with near-atomic resolution. APFIM is particularly useful for the analysis of solute clusters and small precipitate particles, because it can collect atoms exclusively from nanoscale particles embedded in a matrix. These features are suitable for characterizing the complicated microstructures in commercial metallic materials. Recent atom probe investigations on the nanoscale microstructures of the metallic materials are overviewed to demonstrate the unique feature of the APFIM technique.},
doi = {10.1016/S1359-6454(99)00175-5},
journal = {Acta Materialia},
number = 11,
volume = 47,
place = {United States},
year = {1999},
month = {9}
}