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Title: Possible methods of measuring the length of sub-picosecond electron bunches in the frequency domain

Conference ·
OSTI ID:6834005

The traditional method of measuring extremely short electron beams using streak cameras begins to become problematic and expensive at bunch lengths at a picosecond and below. In this paper a few alternatives, based on the differential measurement of the Fourier spectrum of the longitudinal charge distribution of a bunch are suggested and evaluated.

Research Organization:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
AC02-76CH03000
OSTI ID:
6834005
Report Number(s):
FNAL/C-92/379; CONF-9206193-22; ON: DE93007038
Resource Relation:
Conference: Advanced accelerator concepts workshop, Port Jefferson, NY (United States), 14-20 Jun 1992
Country of Publication:
United States
Language:
English