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Title: A graphical user-interface-driven waveform data acquisition and analysis system

Conference ·
OSTI ID:6833063

We have developed a computerized waveform data acquisition and analysis system that uses the graphic user interface of the Macintosh computer. The system provides the means fro acquiring single-shot waveforms from a variety of recorders and digital oscilloscopes on an IEEE-488 instrument bus. The computer interrogates each address on the bus to determine the identity and configuration of any combination of CAMAC crates and oscilloscopes connected to the IEEE-488 bus. Graphic representations of each instrument and/or CAMAC module are displayed on the computer screen. A unique method is used to configure the software to represent graphically the signal path and content. The operator may draw connections through intermediate modules and enter calibrations for signal sources to give a complete data base of transfer functions and signal paths. The data base is used to generate graphs of the waveforms reduced to the desired engineering units. This system is designed to reduce the operator workload and specialized knowledge by providing guidance for the use of a particular instrument. Once acquired, the data may be manipulated by means of several signal-processing functions, such as smoothing, filtering, fitting, and Fourier analysis. Waveforms may be combined into complex data sets for complete Fourier analysis. The data are normally stored in a compact binary format to minimize the impact on archival storage. However, they may be translated to more general ASC2 formates, if desired. Any waveform graphic may be transferred to word-processing and page layout software for publication. 8 figs.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
DOE/DP
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
6833063
Report Number(s):
LA-UR-90-1546; CONF-9003149-3; ON: DE90011948
Resource Relation:
Conference: 3. test technology symposium, Laurel, MD (USA), 19-21 Mar 1990
Country of Publication:
United States
Language:
English