Surface extended x-ray absorption fine structure in the soft-x-ray region: Study of an oxidized Al surface

Journal Article · Sun Oct 15 00:00:00 EDT 1978 · Phys. Rev., B: Solid State; (United States)

DOI:https://doi.org/10.1103/PhysRevB.18.4132· OSTI ID:6783413

Stoehr, J; Denley, D; Perfetti, P

The extended x-ray absorption fine structure (EXAFS) above the oxygen K edge (h..nu.. approx. = 535 eV) has been investigated for an oxidized Al surface. The spectra were obtained using monochromatized synchrotron radiation in the 500--800-eV range and detecting the secondary electron yield from the sample. Pronounced EXAFS was observed extending at least 300 eV beyond the edge. Experiments of the present kind appear to have great applicability for the study of the oxidation and catalytic activity of surfaces.

• Research Organization: Stanford Synchrotron Radiation Laboratory, Stanford University, Stanford, California 94305
• OSTI ID: 6783413
• Journal Information: Phys. Rev., B: Solid State; (United States), Vol. 18:8
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM
CHEMISORPTION
OXIDATION
X-RAY FLUORESCENCE ANALYSIS
CATALYTIC EFFECTS
SURFACE PROPERTIES
CHEMICAL ANALYSIS
CHEMICAL REACTIONS
ELEMENTS
METALS
NONDESTRUCTIVE ANALYSIS
SEPARATION PROCESSES
SORPTION
X-RAY EMISSION ANALYSIS
360104* - Metals & Alloys- Physical Properties