Aplanatic and quasi-aplanatic diffraction gratings

Patent · Mon Sep 14 00:00:00 EDT 1987

OSTI ID:6771068

Hettrick, M C

A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for x-ray or longer wavelength imaging of objects. The variable groove spacing establishes aplanatism or substantially uniform magnetification across the optical aperture. The grating may be sued, for example, in x-ray microscopes or telescopes of the imaging type and in x-ray microprobed. Increased spatial resolution and field of view may be realized in x-ray imaging. 5 figs.

• Research Organization: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
• DOE Contract Number: AC03-76SF00098
• Assignee: LBNL; EDB-88-179309
• Patent Number(s): PATENTS-US-A6095715
• OSTI ID: 6771068
• Resource Relation: Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
GRATINGS
DESIGN
EQUATIONS
SPATIAL RESOLUTION
X-RAY DIFFRACTION
COHERENT SCATTERING
DIFFRACTION
RESOLUTION
SCATTERING
440300* - Miscellaneous Instruments- (-1989)