The MPI/AIT X-ray Imager (MAXI): High speed pn-CCD's for x-ray detection

Conference · Thu Jun 01 00:00:00 EDT 1989

OSTI ID:6762124

Strueder, L; Braeuninger, H; Meier, M; Predehl, P; Reppin, C; Sterzik, M; Truemper, J ^[1]; Cattaneo, P; Hauff, D; Lutz, G; Schuster, K F; Schwarz, A ^[2]; Kenziorra, E; Staubert, A ^[3]

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1. Max-Planck-Institut fuer Physik und Astrophysik, Garching (Germany, F.R.). Inst. fuer Astrophysik
2. Max-Planck-Institut fuer Physik und Astrophysik, Muenchen (Germany, F.R.). Werner-Heisenberg-Inst. fuer Physik
3. Tuebingen

MAXI (MPI/AIT X-RAY Imager) is part of a proposal submitted to the European Space Agency (ESA) as focal plane instrumentation of the X-ray Multi Mission (XMM). Within a collaboration of 13 European institutes we have proposed a fully depleted (sensitive) pn CCD of 280 {mu}m thickness with a homogeneous sensitive area of 36 cm{sup 2} and a pixel size of 150 {times} 150 {mu}m{sup 2} which is well matched with the telescope's angular resolution of 30 arcsec, translating to a position resolution of approximately 1 mm in the focal plane. The X-ray sensitivity is higher than 90% from 250 eV up to 10 keV, the readout time in the full frame mode of the complete focal plane will be 2 ms with a readout noise of better than 5 e{sup {minus}} (rms). Prototypes of all individual components of the camera system have been fabricated and tested. The camera concept will be presented. The measured transfer properties of the CCD and the on-chip electronics will be treated. Taking into account the coupling of the on-chip amplifier to the following front-end electronics the expected performance will be derived.

• Research Organization: Brookhaven National Lab., Upton, NY (USA)
• Sponsoring Organization: DOE/ER
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 6762124
• Report Number(s): BNL-44865; CONF-890247-4; ON: DE91001109
• Resource Relation: Conference: 5. European symposium on semiconductor detectors: new developments on radiation detectors, Munich (Germany, F.R.), 21-23 Feb 1989
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
71 CLASSICAL AND QUANTUM MECHANICS
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COSMIC X-RAY SOURCES
X-RAY DETECTION
CHARGE-COUPLED DEVICES
MOS TRANSISTORS
SEMICONDUCTOR DETECTORS
TELESCOPES
COSMIC RAY SOURCES
DETECTION
MEASURING INSTRUMENTS
RADIATION DETECTION
RADIATION DETECTORS
SEMICONDUCTOR DEVICES
TRANSISTORS
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