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Title: Annealing of radiation damage in graphite

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.325556· OSTI ID:6761160

It is shown from step annealing data for the 002 x-ray diffraction peak that the processes annealing below 200 /sup 0/C possess a frequency factor approx.10/sup 14/ sec/sup -1/, while those processes annealing at higher temperatures possess much lower frequency factors. This is attributed to the lower-temperature processes being associated with the movement of single carbon interstitial atoms and the higher-temperature processes being associated with more complex configurations, including clusters of carbon atoms.

Research Organization:
Argonne National Laboratory, Argonne, Illinois 60439
OSTI ID:
6761160
Journal Information:
J. Appl. Phys.; (United States), Vol. 49:9
Country of Publication:
United States
Language:
English