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Title: Chemical vapor deposition of thin-film polycrystalline Si for low-cost solar cells. Third quarterly technical progress report, February 2, 1980-May 2, 1980

Technical Report ·
OSTI ID:6721735

The program has emphasized a study of the transport properties of p-type polycrystalline Si films as functions of average grain size and impurity doping concentration. Preliminary investigations of nucleation and early-stage growth phenomena in such films have also been carried out to provide improved understanding of the fundamental properties of the films that limit photovoltaic performance and thus to establish a good technical basis for subsequent attempts to achieve improved performance in solar cells using such films. Also, the study of transport properties was extended to n-type polycrystalline Si films. The transport studies have involved preparation of sets of B-doped p-type and P-doped n-type polycrystalline films grown simultaneously by SiH/sub 4/ pyrolysis in H/sub 2/ on polycrystalline high-purity alumina substrates in a range of average grain sizes (approx. 1 ..mu..m to approx. 125 ..mu..m) and with a range of impurity doping concentrations from approx. 10/sup 15/ to >10/sup 20/ cm/sup -3/, primarily at approx. 985/sup 0/C. The p-type films have been characterized in detail by measurements of transport properties of a function of sample temperature in the range 77 to 420/sup 0/K. The results of these investigations are described in detail. In particular, the height of the intergrain barrier in polycrystalline Si as a function of doping concentration as well as average grain size has been determined, and comparisons of these experimental results with the predictions of the grain-boundary trapping model for conduction in polycrystalline Si are made. Sets of CVD polycrystalline and single-crystal films have been used for the fabrication of solar cells, utilizing both vapor-grown and P-diffused junctions. The experimental solar cell structures have had generally poor photovoltaic properties, in most instances for easily diagnosed reasons.

Research Organization:
Rockwell International Corp., Anaheim, CA (USA). Electronic Devices Div.
DOE Contract Number:
AC03-79ET23045
OSTI ID:
6721735
Report Number(s):
SAN-3045-3
Country of Publication:
United States
Language:
English