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Title: The structure and electrical properties of metal contacts on GaAs

Conference ·
OSTI ID:6717323

This paper reports a study of the structural and analytical properties of Au and Al contacts on GaAs and their change in the range of temperatures where the Schottky barrier height changed. The annealing of Au contacts above 290/sup 0/C caused the Schottky barrier height to decrease, an effect opposite to that of Al, where the Schottky barrier height increased upon annealing. An increase in As in the GaAs under the as-deposited metal was consistently found in both cases, whereas annealing seems to change the As/Ga ratio in an opposite way for Au and Al. The orientation relationship of the Au contacts changed upon annealing, which was not observed with the annealed Al. The orientation relationship depended strongly on the surface preparation before the metal deposition and on the annealing environment. It was proposed that the presence of As at the interface can determine the orientation relationship between metals and GaAs.

Research Organization:
Lawrence Berkeley Lab., CA (USA)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
6717323
Report Number(s):
LBL-23016; CONF-870167-1; ON: DE87008217
Resource Relation:
Conference: Conference on physics and chemistry of semiconductor interfaces, Salt Lake City, UT, USA, 27 Jan 1987; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English