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Title: Atomic force microscopy study of the fractal shape of residual barium cuprate/copper oxide flux on the surface of Y[sub 2]Ba[sub 4]Cu[sub 7]O[sub 15] and YBa[sub 2]Cu[sub 4]O[sub 8] single crystals

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
DOI:https://doi.org/10.1116/1.587244· OSTI ID:6658531
 [1]; ;  [2]; ;  [3]
  1. Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel (Switzerland)
  2. Swiss Federal Institute of Technology, Solid State Physics Laboratory, CH-8093 Zuerich (Switzerland)
  3. Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056, Basel (Switzerland)

Atomic force microscopy has been applied to study the surfaces of Y[sub 2]Ba[sub 4]Cu[sub 7]O[sub 15] (247) and YBa[sub 2]Cu[sub 4]O[sub 8] (124) high-temperature superconductor single crystals at ambient temperature and pressure. In contrast to very thin ([lt]10 [mu]m) crystal platelets, which exhibit by scanning tunneling microscopy clean terraces with steps of the height of one or multiple unit cells, thicker crystals show surfaces partially covered by a contamination layer with a highly curved boundary line originating from BaCuO[sub 2]/CuO flux used to grow 124 and 247 single crystals under high oxygen pressure. The evaluation of the length of such flux boundaries by the box counting method reveals that they are fractal with a fractal dimension of about 1.4. Close to crystal steps, higher fractal dimensions are observed provided the terrace width is sufficiently large. The fact that the residual flux is always found on the lower terrace level of a crystal step allows discussion of a possible mechanism of flux migration on the crystal surface.

OSTI ID:
6658531
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Vol. 12:3; ISSN 0734-211X
Country of Publication:
United States
Language:
English