Segmented wire ion chambers (SWICs) used as proton beam position/profile detectors in the fixed target beamlines at Fermilab

Journal Article · Sun Feb 01 00:00:00 EST 1998 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.55066· OSTI ID:664966

Tassotto, G ^[1]

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1. Fermi National Accelerator Laboratory, P.O. Box 500, Batavia, Illinois 60510 (United States)

Segmented Wire Ion Chambers have been used at Fermilab since 1972 to monitor the profile of the proton beams in the various beamlines. Many modifications and improvements have been made since that time. SWICs are presently used to display beam profiles at intensities from 10{sup 6} to over 10{sup 13} particles/sec. {copyright} {ital 1998 American Institute of Physics.}

• Research Organization: Fermi National Accelerator Laboratory
• Sponsoring Organization: USDOE
• DOE Contract Number: AC02-76CH03000
• OSTI ID: 664966
• Report Number(s): CONF-9707140-; ISSN 0094-243X; TRN: 98:011142
• Journal Information: AIP Conference Proceedings, Vol. 422, Issue 1; Conference: 7. ICFA school on instrumentation in elementary particle physics, Leon (Mexico), 7-19 Jul 1997; Other Information: PBD: Feb 1998
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
PROTON BEAMS
BEAM MONITORS
MULTIWIRE PROPORTIONAL CHAMBERS
BEAM PROFILES
DESIGN
FERMILAB TEVATRON
ELECTRONIC CIRCUITS
BEAM POSITION