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Title: Catalog of computer simulated TEM images of small FCC and BCC dislocation loops

Abstract

Interest in rapidly quenched materials, radiation damage and the initial stages of phase transformations has created the need for a method to identify small strain centers observed by transmission electron microscopy. This report is an outgrowth of this general area of interest and concerns itself primarily with the images of small dislocation loops (r < 0.25 xi g). The various parameters important in determining an image are presented and a catalog of computer simulated images for a large number of loop crystallographies imaged under a large number of beam direction and diffracting vector combinations is assembled. The program which produced the images is also described and included with annotation.

Authors:
; ;
Publication Date:
Research Org.:
Oak Ridge National Lab., TN (USA)
OSTI Identifier:
6649082
Report Number(s):
ORNL/TM-7619
TRN: 81-005263
DOE Contract Number:  
W-7405-ENG-26
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BCC LATTICES; DISLOCATIONS; CRYSTAL DEFECTS; COMPUTERIZED SIMULATION; FCC LATTICES; COMPUTER CALCULATIONS; CRYSTAL LATTICES; ELECTRON MICROSCOPY; IMAGES; STRAINS; CRYSTAL STRUCTURE; CUBIC LATTICES; LINE DEFECTS; MICROSCOPY; SIMULATION; 656000* - Condensed Matter Physics

Citation Formats

Sykes, L. J., Cooper, W. D., and Hren, J. J. Catalog of computer simulated TEM images of small FCC and BCC dislocation loops. United States: N. p., 1981. Web. doi:10.2172/6649082.
Sykes, L. J., Cooper, W. D., & Hren, J. J. Catalog of computer simulated TEM images of small FCC and BCC dislocation loops. United States. doi:10.2172/6649082.
Sykes, L. J., Cooper, W. D., and Hren, J. J. Sun . "Catalog of computer simulated TEM images of small FCC and BCC dislocation loops". United States. doi:10.2172/6649082. https://www.osti.gov/servlets/purl/6649082.
@article{osti_6649082,
title = {Catalog of computer simulated TEM images of small FCC and BCC dislocation loops},
author = {Sykes, L. J. and Cooper, W. D. and Hren, J. J.},
abstractNote = {Interest in rapidly quenched materials, radiation damage and the initial stages of phase transformations has created the need for a method to identify small strain centers observed by transmission electron microscopy. This report is an outgrowth of this general area of interest and concerns itself primarily with the images of small dislocation loops (r < 0.25 xi g). The various parameters important in determining an image are presented and a catalog of computer simulated images for a large number of loop crystallographies imaged under a large number of beam direction and diffracting vector combinations is assembled. The program which produced the images is also described and included with annotation.},
doi = {10.2172/6649082},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1981},
month = {2}
}