High voltage and high resolution electron microscopy in materials science
Journal Article
·
· J. Met.; (United States)
A brief review is given of the principles and some applications of transmission electron microscopy at high voltages and high resolutions. The combination of high resolution electron imaging and laser optical microdiffraction shows great promise for lattice parameter measurements over localized regions (approximately 10A) from which estimates of composition changes can be made.
- Research Organization:
- Univ. of California, Berkeley, CA (United States)
- OSTI ID:
- 6636742
- Journal Information:
- J. Met.; (United States), Journal Name: J. Met.; (United States)
- Country of Publication:
- United States
- Language:
- English
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