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Title: Exciton-exciton annihilation and exciton kinetics in poly(di-[ital n]-hexylsilane)

Journal Article · · Physical Review, B: Condensed Matter; (United States)
 [1];  [2]
  1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
  2. Department of Chemistry, Princeton University, Princeton, New Jersey 08544 (United States)

We have found that charge carriers can be generated by exciton-exciton annihilation in solid films of poly(di-[ital n]-hexylsilane). We use this phenomenon to study the kinetics of excitons at ambient temperature and show that the rate constant for exciton-exciton annihilation [gamma] is 2[times]10[sup [minus]7] cm[sup 3] s[sup [minus]1], in excellent agreement with the value we obtained previously by other means. The quantum efficiency for carrier production, at an electric field of 2[times]10[sup 5] V cm[sup [minus]1], is 1.3[times]10[sup [minus]3] per annihilation event. We also show that [gamma] is independent of the initial energy of the exciton state, even to energies far out on the long-wavelength tail of the exciton absorption band, and that the excitons remain mobile throughout their 600-ps lifetime.

DOE Contract Number:
AC04-76DP00789
OSTI ID:
6630998
Journal Information:
Physical Review, B: Condensed Matter; (United States), Vol. 47:15; ISSN 0163-1829
Country of Publication:
United States
Language:
English