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Title: X-ray excited optical luminescence (XEOL) detection of x-ray absorption fine structure (XAFS)

Abstract

The x-ray excited optical luminescence (XEOL) from a variety of rare-earth ions was used as a detection mode for the collection of {ital L}-edge x-ray absorption fine-structure (XAFS) data. In order to understand the source of the observed optical signal, advantage is taken of the known luminescent response of {ital f} ions in a variety of transparent host materials. Whereas some samples exhibit an optical response that is indistinguishable from the transmission XAFS data, other samples show marked differences between the data obtained with the two different detection schemes. The unexpected optical luminescence of a Gd{sub 2}O{sub 3} sample is traced to a Eu impurity. An optical spectrum of 0.4{percent} Tb in Gd{sub 2}O{sub 2}S, excited by x-ray photons at the Gd edge, is used to demonstrate that the optical signal may arise from an ion different from the absorbing ion. The implications of this energy transfer are discussed in terms of the suitability of XEOL as a detection scheme for XAFS spectroscopy. {copyright} {ital 1998 American Institute of Physics.}

Authors:
; ;  [1];  [2]
  1. Chemistry Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  2. The EXAFS Co., Pioche, Nevada 89043 (United States)
Publication Date:
OSTI Identifier:
662184
Resource Type:
Journal Article
Journal Name:
Journal of Chemical Physics
Additional Journal Information:
Journal Volume: 109; Journal Issue: 16; Other Information: PBD: Oct 1998
Country of Publication:
United States
Language:
English
Subject:
66 PHYSICS; FINE STRUCTURE; X-RAY SPECTROSCOPY; PHOTOLUMINESCENCE; GADOLINIUM OXIDES; ENERGY TRANSFER; IMPURITIES; INNER-SHELL EXCITATION

Citation Formats

Soderholm, L, Liu, G K, Antonio, M R, and Lytle, F W. X-ray excited optical luminescence (XEOL) detection of x-ray absorption fine structure (XAFS). United States: N. p., 1998. Web. doi:10.1063/1.477320.
Soderholm, L, Liu, G K, Antonio, M R, & Lytle, F W. X-ray excited optical luminescence (XEOL) detection of x-ray absorption fine structure (XAFS). United States. doi:10.1063/1.477320.
Soderholm, L, Liu, G K, Antonio, M R, and Lytle, F W. Thu . "X-ray excited optical luminescence (XEOL) detection of x-ray absorption fine structure (XAFS)". United States. doi:10.1063/1.477320.
@article{osti_662184,
title = {X-ray excited optical luminescence (XEOL) detection of x-ray absorption fine structure (XAFS)},
author = {Soderholm, L and Liu, G K and Antonio, M R and Lytle, F W},
abstractNote = {The x-ray excited optical luminescence (XEOL) from a variety of rare-earth ions was used as a detection mode for the collection of {ital L}-edge x-ray absorption fine-structure (XAFS) data. In order to understand the source of the observed optical signal, advantage is taken of the known luminescent response of {ital f} ions in a variety of transparent host materials. Whereas some samples exhibit an optical response that is indistinguishable from the transmission XAFS data, other samples show marked differences between the data obtained with the two different detection schemes. The unexpected optical luminescence of a Gd{sub 2}O{sub 3} sample is traced to a Eu impurity. An optical spectrum of 0.4{percent} Tb in Gd{sub 2}O{sub 2}S, excited by x-ray photons at the Gd edge, is used to demonstrate that the optical signal may arise from an ion different from the absorbing ion. The implications of this energy transfer are discussed in terms of the suitability of XEOL as a detection scheme for XAFS spectroscopy. {copyright} {ital 1998 American Institute of Physics.}},
doi = {10.1063/1.477320},
journal = {Journal of Chemical Physics},
number = 16,
volume = 109,
place = {United States},
year = {1998},
month = {10}
}