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Title: Applications of synchrotron x-ray diffraction topography to fractography

Abstract

Fractographs have been taken using a variety of probes each of which produces different types of information. Methods which have been used to examine fracture surfaces include: (a) optical microscopy, particularly interference contrast methods, (b) scanning electron microscopy (SEM), (c) SEM with electron channelling, (d) SEM with selected-area electron channelling, (e) Berg-Barrett (B-B) topography, and now (f) synchrotron x-radiation fractography (SXRF). This review concentrated on the role that x-ray methods can play in such studies. In particular, the ability to nondestructively assess the subsurface microstructure associated with the fracture to depths of the order of 5 to 10 ..mu..m becomes an important attribute for observations of a large class of semi-brittle metals, semiconductors and ceramics.

Authors:
Publication Date:
Research Org.:
State Univ. of New York, Stony Brook (USA). Dept. of Materials Science and Engineering
OSTI Identifier:
6612477
Report Number(s):
DOE/ER/45098-2; CONF-830887-5
ON: DE84016257
DOE Contract Number:  
FG02-84ER45098
Resource Type:
Conference
Resource Relation:
Conference: Joint meeting of American Crystallographic Association and Denver X-ray conference, Snowmass, CO, USA, 1 Aug 1983; Other Information: Portions are illegible in microfiche products
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 36 MATERIALS SCIENCE; FRACTOGRAPHY; X-RAY DIFFRACTION; MOLYBDENUM; NIOBIUM; SYNCHROTRON RADIATION; BREMSSTRAHLUNG; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; METALS; RADIATIONS; SCATTERING; TRANSITION ELEMENTS; 420500* - Engineering- Materials Testing; 360103 - Metals & Alloys- Mechanical Properties

Citation Formats

Bilello, J C. Applications of synchrotron x-ray diffraction topography to fractography. United States: N. p., 1983. Web.
Bilello, J C. Applications of synchrotron x-ray diffraction topography to fractography. United States.
Bilello, J C. 1983. "Applications of synchrotron x-ray diffraction topography to fractography". United States.
@article{osti_6612477,
title = {Applications of synchrotron x-ray diffraction topography to fractography},
author = {Bilello, J C},
abstractNote = {Fractographs have been taken using a variety of probes each of which produces different types of information. Methods which have been used to examine fracture surfaces include: (a) optical microscopy, particularly interference contrast methods, (b) scanning electron microscopy (SEM), (c) SEM with electron channelling, (d) SEM with selected-area electron channelling, (e) Berg-Barrett (B-B) topography, and now (f) synchrotron x-radiation fractography (SXRF). This review concentrated on the role that x-ray methods can play in such studies. In particular, the ability to nondestructively assess the subsurface microstructure associated with the fracture to depths of the order of 5 to 10 ..mu..m becomes an important attribute for observations of a large class of semi-brittle metals, semiconductors and ceramics.},
doi = {},
url = {https://www.osti.gov/biblio/6612477}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Jan 01 00:00:00 EST 1983},
month = {Sat Jan 01 00:00:00 EST 1983}
}

Conference:
Other availability
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