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Title: The single event upset environment for avionics at high latitude

Abstract

Modern avionic systems for civil and military applications are becoming increasingly reliant upon embedded microprocessors and associated memory devices. The phenomenon of single event upset (SEU) is well known in space systems and designers have generally been careful to use SEU tolerant devices or to implement error detection and correction (EDAC) techniques where appropriate. In the past, avionics designers have had no reason to consider SEU effects but is clear that the more prevalent use of memory devices combined with increasing levels of IC integration will make SEU mitigation an important design consideration for future avionic systems. To this end, it is necessary to work towards producing models of the avionics SEU environment which will permit system designers to choose components and EDAC techniques which are based on predictions of SEU rates correct to much better than an order of magnitude. Measurements of the high latitude SEU environment at avionics altitude have been made on board a commercial airliner. Results are compared with models of primary and secondary cosmic rays and atmospheric neutrons. Ground based SEU tests of static RAMs are used to predict rates in flight.

Authors:
; ;  [1]; ;  [2];  [3]
  1. (Defence Research Agency, Farnborough (United Kingdom). Space and Communications Dept.)
  2. (SAAB Military Aircraft, Linkoeping (Sweden))
  3. (AEA Technology, Oxfordshire (United Kingdom). Harwell Lab.)
Publication Date:
OSTI Identifier:
6559077
Alternate Identifier(s):
OSTI ID: 6559077
Report Number(s):
CONF-940726--
Journal ID: ISSN 0018-9499; CODEN: IETNAE
Resource Type:
Conference
Journal Name:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
Additional Journal Information:
Journal Volume: 41:6Pt1; Conference: 31. annual international nuclear and space radiation effects conference, Tucson, AZ (United States), 18-22 Jul 1994; Journal ID: ISSN 0018-9499
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; COSMIC RADIATION; RADIATION DETECTION; EARTH ATMOSPHERE; NEUTRON FLUX; ELECTRONIC EQUIPMENT; PHYSICAL RADIATION EFFECTS; COMPARATIVE EVALUATIONS; ERRORS; EXPERIMENTAL DATA; MATHEMATICAL MODELS; MEMORY DEVICES; DATA; DETECTION; EQUIPMENT; EVALUATION; INFORMATION; IONIZING RADIATIONS; NUMERICAL DATA; RADIATION EFFECTS; RADIATION FLUX; RADIATIONS 440200* -- Radiation Effects on Instrument Components, Instruments, or Electronic Systems

Citation Formats

Sims, A.J., Dyer, C.S., Peerless, C.L., Johansson, K., Pettersson, H., and Farren, J. The single event upset environment for avionics at high latitude. United States: N. p., 1994. Web.
Sims, A.J., Dyer, C.S., Peerless, C.L., Johansson, K., Pettersson, H., & Farren, J. The single event upset environment for avionics at high latitude. United States.
Sims, A.J., Dyer, C.S., Peerless, C.L., Johansson, K., Pettersson, H., and Farren, J. Thu . "The single event upset environment for avionics at high latitude". United States.
@article{osti_6559077,
title = {The single event upset environment for avionics at high latitude},
author = {Sims, A.J. and Dyer, C.S. and Peerless, C.L. and Johansson, K. and Pettersson, H. and Farren, J.},
abstractNote = {Modern avionic systems for civil and military applications are becoming increasingly reliant upon embedded microprocessors and associated memory devices. The phenomenon of single event upset (SEU) is well known in space systems and designers have generally been careful to use SEU tolerant devices or to implement error detection and correction (EDAC) techniques where appropriate. In the past, avionics designers have had no reason to consider SEU effects but is clear that the more prevalent use of memory devices combined with increasing levels of IC integration will make SEU mitigation an important design consideration for future avionic systems. To this end, it is necessary to work towards producing models of the avionics SEU environment which will permit system designers to choose components and EDAC techniques which are based on predictions of SEU rates correct to much better than an order of magnitude. Measurements of the high latitude SEU environment at avionics altitude have been made on board a commercial airliner. Results are compared with models of primary and secondary cosmic rays and atmospheric neutrons. Ground based SEU tests of static RAMs are used to predict rates in flight.},
doi = {},
journal = {IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)},
issn = {0018-9499},
number = ,
volume = 41:6Pt1,
place = {United States},
year = {1994},
month = {12}
}

Conference:
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