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Title: Reflectivity and resolution x-ray dispersive and reflective structures for carbon, beryllium and boron analysis

Abstract

This patent describes a method for the wavelength dispersive spectroscopic analysis for a light metal chosen from the group consisting of beryllium and boron, comprising the steps of: providing a sample; direction a beam of X-rays at the sample, to cause the sample to emit fluorescent radiation X-rays; directing the emitted X-rays onto an X-ray dispersive structure and reflecting the X-rays from the X-ray dispersive structure to a detector; and detecting the reflected X-rays to perform the analysis; the improvement wherein the X-ray dispersive structure includes layer pairs formed on one another, one layer of the layer pair being formed of B/sub 4/C, the other layer of the layer pair being formed of vacuum deposited molybdenum, and the layer pairs having a d spacing of 35 to 200 Angstrom, whereby the layer pairs have X-ray dispersive properties over a predetermined first wavelength range of interest, and a maximum net peak to background ratio at a narrow second wavelength range of 55 to 130 Angstroms within the predetermined wavelength range of interest for the detection of beryllium and boron. It also describes a method for the spectroscopic analysis for carbon comprising the steps of: providing a sample; directing a beam ofmore » X-rays at the sample, to cause the sample to emit fluorescent radiation X-rays; directing the emitted X-rays onto an X-ray dispersive structure and reflecting the X-rays from the X-ray dispersive structure to a detector; the improvement wherein the X-ray dispersive structure comprises a plurality of layer pairs formed on one another, one layer of the layer pair being formed of carbon, and the other layer of the layer pairs being formed of a vacuum deposited transition metal chosen from the group consisting of nickel and vanadium.« less

Inventors:
;
Publication Date:
OSTI Identifier:
6549662
Patent Number(s):
US 4785470
Application Number:
TRN: 89-004414
Assignee:
Ovonic Synthetic Materials Co., Inc., Troy, MI
Resource Type:
Patent
Resource Relation:
Patent File Date: Filed date 25 Apr 1986
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; BERYLLIUM; X-RAY SPECTROSCOPY; BORON; CARBON; LAYERS; NICKEL; QUANTITATIVE CHEMICAL ANALYSIS; REFLECTION; RESOLUTION; SAMPLING; VANADIUM; X-RAY DETECTION; ALKALINE EARTH METALS; CHEMICAL ANALYSIS; DETECTION; ELEMENTS; METALS; NONMETALS; RADIATION DETECTION; SEMIMETALS; SPECTROSCOPY; TRANSITION ELEMENTS; 400201* - Chemical & Physicochemical Properties; 400102 - Chemical & Spectral Procedures

Citation Formats

Wood, J L, and Hart, K L. Reflectivity and resolution x-ray dispersive and reflective structures for carbon, beryllium and boron analysis. United States: N. p., 1988. Web.
Wood, J L, & Hart, K L. Reflectivity and resolution x-ray dispersive and reflective structures for carbon, beryllium and boron analysis. United States.
Wood, J L, and Hart, K L. Tue . "Reflectivity and resolution x-ray dispersive and reflective structures for carbon, beryllium and boron analysis". United States.
@article{osti_6549662,
title = {Reflectivity and resolution x-ray dispersive and reflective structures for carbon, beryllium and boron analysis},
author = {Wood, J L and Hart, K L},
abstractNote = {This patent describes a method for the wavelength dispersive spectroscopic analysis for a light metal chosen from the group consisting of beryllium and boron, comprising the steps of: providing a sample; direction a beam of X-rays at the sample, to cause the sample to emit fluorescent radiation X-rays; directing the emitted X-rays onto an X-ray dispersive structure and reflecting the X-rays from the X-ray dispersive structure to a detector; and detecting the reflected X-rays to perform the analysis; the improvement wherein the X-ray dispersive structure includes layer pairs formed on one another, one layer of the layer pair being formed of B/sub 4/C, the other layer of the layer pair being formed of vacuum deposited molybdenum, and the layer pairs having a d spacing of 35 to 200 Angstrom, whereby the layer pairs have X-ray dispersive properties over a predetermined first wavelength range of interest, and a maximum net peak to background ratio at a narrow second wavelength range of 55 to 130 Angstroms within the predetermined wavelength range of interest for the detection of beryllium and boron. It also describes a method for the spectroscopic analysis for carbon comprising the steps of: providing a sample; directing a beam of X-rays at the sample, to cause the sample to emit fluorescent radiation X-rays; directing the emitted X-rays onto an X-ray dispersive structure and reflecting the X-rays from the X-ray dispersive structure to a detector; the improvement wherein the X-ray dispersive structure comprises a plurality of layer pairs formed on one another, one layer of the layer pair being formed of carbon, and the other layer of the layer pairs being formed of a vacuum deposited transition metal chosen from the group consisting of nickel and vanadium.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1988},
month = {11}
}