X-ray and vacuum ultraviolet interaction data bases, calculations, and measurements; Proceedings of the Meeting, Los Angeles, CA, Jan. 14, 15, 1988
Various papers on X-ray and vacuum ultraviolet interaction data bases, calculations, and measurements are presented. Individual topics addressed include: photoabsorption and photoionization cross sections, a program to obtain reliable photoabsorption cross sections, photoionization of small molecules using synchrotron radiation, components of the photoionization cross section in the VUV and soft X-ray region, photoabsorption and fluorescence cross sections of halogen compounds in VUV, near-threshold X-ray fluorescence spectroscopy of molecules, atomic processes in tokamak plasmas, and photoionization studies of atomic oxygen and nitrogen. Also considered are: constraints and data base of X-ray optical properties, theory of anomalous X-ray scattering from atoms and ions, preparation of multilayered X-ray photoabsorption targets, composition and thickness of multilayer foils using MeV ion-beam techniques, recent developments with VUV and soft X-ray detector systems, and measurements of X-ray fluorescence yields of plastics by photoexcitation.
- OSTI ID:
- 6538600
- Report Number(s):
- CONF-8801115-; TRN: 89-002906
- Resource Relation:
- Conference: X-ray and vacuum ultraviolet interaction data bases, calculations, and measurements, Los Angeles, CA, USA, 14 Jan 1988; Related Information: SPIE Proceedings. Volume 911
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
47 OTHER INSTRUMENTATION
ULTRAVIOLET RADIATION
MEETINGS
X RADIATION
ABSORPTION SPECTRA
ATOMIC PHYSICS
CARBON
CONSTRAINTS
DATA BASE MANAGEMENT
ENERGY LEVELS
FAR ULTRAVIOLET RADIATION
FLUORESCENCE SPECTROSCOPY
HALOGENS
LIGHT SCATTERING
MOLECULES
NITROGEN
OXYGEN
PHOTOIONIZATION
PLASMA
RADIATION DETECTORS
SILICON OXIDES
SOFT X RADIATION
SPECTROSCOPY
SYNCHROTRON RADIATION
X-RAY SPECTROSCOPY
BREMSSTRAHLUNG
CHALCOGENIDES
ELECTROMAGNETIC RADIATION
ELEMENTS
EMISSION SPECTROSCOPY
IONIZATION
IONIZING RADIATIONS
MANAGEMENT
MEASURING INSTRUMENTS
NONMETALS
OXIDES
OXYGEN COMPOUNDS
PHYSICS
RADIATIONS
SCATTERING
SILICON COMPOUNDS
SPECTRA
640300* - Atomic
Molecular & Chemical Physics
440300 - Miscellaneous Instruments- (-1989)