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Title: X-ray-absorption fine-structure studies of superconducting Tl sub 2 CaBa sub 2 Cu sub 2 O sub x thin films

Journal Article · · Physical Review, B: Condensed Matter; (USA)
; ; ;  [1]
  1. Department of Applied Science, Brookhaven National Laboratory, Upton, NY (USA)

Superconducting Tl-Ca-Ba-Cu-O thin films have been prepared by the technique of reactive magnetron sputtering using targets of Tl, Ca-Ba, and Cu. Three films with different quality superconducting transitions were fabricated and analyzed. X-ray-absorption fine-structure measurements were performed on the Cu {ital K} edge in order to determine orientation, bond lengths, number of nearest neighbors, and relative disorder as a function of the quality of their superconducting transition. Magnetically oriented powder samples of the appropriate superconducting phase were used for comparison. X-ray-absorption near-edge results reveal increasing CuO{sub 2} plane orientation parallel to the substrate as the quality of the superconducting transition improved, consistent with x-ray-diffraction data. Extended x-ray-absorption fine-structure (EXAFS) measurements also show this trend. EXAFS gives a Cu-O(1) bond length of 1.92{plus minus}0.01 A for all three films, and all three samples exhibit an increasing Debye-Waller disorder factor consistent with the deterioration in the quality of their superconducting transitions.

DOE Contract Number:
AC02-76CH00016
OSTI ID:
6534526
Journal Information:
Physical Review, B: Condensed Matter; (USA), Vol. 42:1; ISSN 0163-1829
Country of Publication:
United States
Language:
English